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Quantitatively Modeling Application Resiliency with the Data Vulnerability Factor...

by Li Yu, Dong Li, Sparsh Mittal, Jeffrey S Vetter
Publication Type
Conference Paper
Publication Date
Page Numbers
695 to 706
Conference Name
ACM/IEEE International Conference for High Performance Computing, Networking, Storage, and Analysis
Conference Location
New Oreland, Louisiana, United States of America
Conference Date
-