Publication Type
Journal
Journal Name
Journal of Electron Microscopy
Publication Date
Page Numbers
195 to 201
Volume
57
Issue
6
Abstract
We derive a simple to implement method to approximately measure the aberration function for a crystalline specimen from an inline hologram. We demonstrate measurement of aberrations up to third order for a scanning transmission electron microscope from both dynamical simulations and experimental Ronchigrams. This method should allow rapid fine-tuning on a variety of crystalline specimens and represents a key step towards adaptive optics for electron microscopy.
