Publication Type
Journal
Journal Name
Applied Physics Letters
Publication Date
Page Number
2980031
Volume
93
Issue
11
Abstract
A rapid multidimensional spectroscopic imaging approach in scanning probe microscopy is developed and applied to piezoresponse force spectroscopy. Evolution of resonance frequency, dissipation, and piezoresponse signal at each point during acquisition of local hysteresis loops provides information on polarization dynamics and voltage dependent contact mechanics of ferroelectric surfaces. The measurements illustrate significant frequency shifts during piezoresponse force spectroscopy, necessitating the use of frequency-tracking methods. The method is universal and can be extended to other scanning probe microscopy techniques. (C) 2008 American Institute of Physics.
