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Publication

Resolution Quality and Atom Positions in Sub-?ngstr?m Electron Microscopy...

by Michael O'keefe, Lawrence F Allard Jr, Douglas Blom
Publication Type
Conference Paper
Book Title
Proceedings Microscopy and Microanalysis 2005
Publication Date
Volume
11
Conference Name
Microscopy and Microanalysis 2005
Conference Location
Honolulu, Hawaii, United States of America
Conference Sponsor
Microscopy Society of America
Conference Date
-