Publication Type
Conference Paper
Journal Name
Surface and Interface Analysis
Publication Date
Page Numbers
291 to 293
Volume
2014
Issue
46
Conference Name
19th International Conference on Secondary Ion Mass Spectrometry – SIMS 19
Conference Location
Jeju, South Korea
Conference Date
-
Abstract
A Secondary Ion Mass Spectrometry (SIMS) method has been developed to measure stable Mg isotope tracer diffusion. This SIMS method was then used to calculate Mg self- diffusivities and the data was verified against historical data measured using radio tracers. The SIMS method has been validated as a reliable alternative to the radio-tracer technique for the measurement of Mg self-diffusion coefficients and can be used as a routine method for determining diffusion coefficients.
