Abstract
Abstract—A procedure is developed for assessing the epitaxy
of La(2-x)Zr(2+x)O(7) (LZO) layers on NiW RABITS. Comparing
XRD patterns (theta / 2-theta scans and 2D rocking curves) of LZO films
of known thickness (ellipsometry or reflectometry measurements)
with those of standard samples (100% epitaxial LZO film and an
isotropic LZO pellet of known density), we estimate the epitaxial (EF), and polycrystalline (PF) fractions of LZO within the
layer. The procedure was tested using MOD-LZO(100 nm)/NiW
tape samples with varied from 3 to 90% (reproducibly
prepared by varying the humidity of
Ar-5%H2 gas during
heat treatment). A qualitative agreement with RHEED and quantitative
(within 10%) agreement with the EBSD results was
shown. Correlation between EF and Jc in 600 nm thick YBCO
layer deposited on MOD-LZO/NiW using thermal coevaporation
enables us to impose the
EF=80% margin on the quality of
LZO layer for the particular conductor architecture.
