Publication Type
Book Chapter
Publication Date
Page Numbers
33 to 60
Publisher Name
Springer
Publisher Location
New York, New York, United States of America
Abstract
In-Situ and time-resolved X-ray scattering and diffraction is dedicated to yielding the change of structural information as the materials are processed or grown in a controlled environment. In this chapter, we introduce the use of in situ and time-resolved X-ray techniques to understand molecular packing, crystal orientation, and phase transformation during the synthesis and processing of functional organic semiconductors, organic nanowires, and hybrid perovskite materials.
