Publication Type
Journal
Journal Name
ACS Nano
Publication Date
Page Numbers
6806 to 6815
Volume
7
Issue
8
Abstract
A novel scanning probe microscopy (SPM) based technique for probing local ionic and electronic transport and their dynamic behavior on the 10 ms – 10 s scale is presented. The time-resolved Kelvin Probe Force Microscopy (tr-KPFM) allows mapping surface potential in both space and time domains, visualizing electronic and ionic charge dynamics and separating underlying processes based on their time responses. Here, tr-KPFM is employed to explore the interplay of the adsorbed surface ions and bulk oxygen vacancies and their role in the resistive switching in the Ca-substituted bismuth ferrite thin film.
