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Spatially Resolved Characterization of Microstructure, Defects and Tilts in GaN Layers Grown on Si(111) Substrates by Maskles...

Publication Type
Conference Paper
Book Title
Silicon-Based Microphotonics
Publication Date
Volume
934
Conference Name
Spring 2006 Materials Research Society Proceedings
Conference Location
San Francisco, California, United States of America
Conference Sponsor
Materials Research Society
Conference Date
-