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Structural stability of single-layer MoS2 under large strain...

by Xiaofeng Fan, W.t. Zheng, Jer-lai Kuo, David J Singh
Publication Type
Journal
Journal Name
Journal of Physics: Condensed Matter
Publication Date
Page Number
105401
Volume
27
Issue
10

Out-of-plane relaxation can introduce MoS2 in flexible electronic/optoelectronic devices, while under larger strain it is possible to frustrate the structure of MoS2. On the basis of first-principle calculations, the ideal tensile stress strain relations and failure mechanism of single-layer MoS2 structure under large strain is investigated. The instability of phonon modes near the K point results in the decrease of tensile stress under large strain. The relative out-of-plane movement of Mo atoms is found to contribute to the mechanism of the soft phonon mode.