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Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films ...

Publication Type
Journal
Journal Name
APL Materials
Publication Date
Volume
3
Issue
036106

Spatial variability of conductivity in ceria is explored using scanning probe microscopy
with galvanostatic control. Ionically blocking electrodes are used to probe the
conductivity under opposite polarities to reveal possible differences in the defect
structure across a thin film of CeO2. Data suggest the existence of a large spatial
inhomogeneity that could give rise to constant phase elements during standard electrochemical
characterization, potentially affecting the overall conductivity of films
on the macroscale. The approach discussed here can also be utilized for other mixed
ionic electronic conductor systems including memristors and electroresistors, as well
as physical systems such as ferroelectric tunneling barriers