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TEM Characterization of Tensile-Tested 14YWT Nanostructured Ferritic Alloys...

by James Bentley, David T Hoelzer
Publication Type
Conference Paper
Journal Name
Microscopy and Microanalysis
Publication Date
Page Numbers
1416 to 1417
Volume
14
Issue
suppl 2
Conference Name
Microscopy and Microanalysis 2008
Conference Location
Albuquerque, New Mexico, United States of America
Conference Sponsor
Microscopy Soc Amer, Microbeam Analysis Soc, Intern Metallographic Soc, Intern Soc Analytic Cytology
Conference Date
-