Publication Type
Conference Paper
Journal Name
CLEO: Applications and Technology
Publication Date
Page Number
117
Volume
2019
Issue
JW2A
Conference Name
CLEO: Applications and Technology 2019
Conference Location
San Jose, California, United States of America
Conference Sponsor
OSA
Conference Date
-
Abstract
We show that relative beam displacement measurements with two-mode squeezed light sources are identical to truncated SU(1,1) interferometers, enabling a new quantum-enhanced atomic force microscopy suitable for broadband characterization of high-speed dynamics in materials.
