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A Versatile Common Platform for Quantum Transport Measurements in Fluidic, Cryogenic, and In Situ Electron Microscopy Environ...

by Jacob Swett, Ivan I Kravchenko, Ondrej E Dyck, Stephen Jesse, J Mol
Publication Type
Conference Paper
Journal Name
Microscopy and Microanalysis
Publication Date
Page Numbers
972 to 973
Volume
25
Issue
S2
Conference Name
M&M 2019
Conference Location
Portland, Oregon, United States of America
Conference Sponsor
Microscopy Society of America
Conference Date
-