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Publication

X-Ray Characterization of Atomistic Defects Causing Irradiation Creep of SiC...

by Takaaki Koyanagi, David Sprouster, Lance Snead, Yutai Kato
Publication Type
Conference Paper
Book Title
2020 ANS Virtual Winter Meeting summary
Publication Date
Conference Name
2020 ANS Winter Meeting and Nuclear Technology Expo
Conference Location
Chicago, Illinois, United States of America
Conference Sponsor
GSE, Exelon, TerraPower
Conference Date
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