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X-ray Microbeam Diffraction Measurements in Polycrystalline Aluminum and Copper Thin Films...

by L. Moyer, Iii G. Cargill, Wenge Yang, Bennett C Larson, Gene E Ice
Publication Type
Conference Paper
Book Title
Thin Films - Stresses and Mechanical Properties X
Publication Date
Page Number
15
Volume
795
Conference Name
2003 MRS Fall Meeting
Conference Location
Boston, Massachusetts, United States of America
Conference Sponsor
Materials Research Society
Conference Date
-