Sergei V Kalinin Collaborator, University of Tennessee Contact kalininsv@ornl.gov | 865.241.0236 All Publications Deep data mining in a real space: Separation of intertwined electronic responses in a lightly-doped BaFe2As2... Chemical state evolution in ferroelectric films during tip-induced polarization and electroresistive switching... Atomic intercalation – a practical method to measure the nanoscale adhesion energy of graphene on HOPG... Quantification of Surface Displacements via Cantilever Contact Resonance in Dynamic Atomic Force Microscopy... Size-effect in layered ferrielectric CuInP2S6... Fundamental aspects of electric double layer force-distance measurements at liquid-solid interfaces using atomic force micros... Imaging via complete cantilever dynamic detection: General Dynamic Mode Imaging and Spectroscopy in Scanning Probe Microscopy... Big, deep, and smart data in scanning probe microscopy... Single domain multiferroic BiFeO3 films... Distortion Correction in Scanning Transmission Electron Microcopy with Controllable Scanning Pathways... Phases and interfaces from real space atomically resolved data: physics based deep data image analysis... Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space... Nanoforging of Single Layer MoSe2 Through Defect Engineering with Focused Helium Ion Beams... Direct-write liquid phase transformations with a scanning transmission electron microscope... Full information acquisition and analysis of reflection high energy electron diffraction data for epitaxial growth processes... Local coexistence of VO2 phases revealed by deep data analysis... Data Analytics Applied to Chemical Transformations in Liquids... Phase determination from atomically resolved images: physics-constrained deep data analysis through an unmixing approach... G-Mode Magnetic Force Microscopy: Separating magnetic and electrostatic interactions using big data analytics... Directing Matter: Towards Atomic Scale 3D Nanofabrication... Dynamic scan control in STEM: Spiral scans... BEAM: A computational workflow system for managing and modeling material characterization data in HPC environments... Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy... The role of associated defects in oxygen ion conduction and surface exchange reaction for epitaxial samaria doped ceria thin ... Big Data Analytics for Scanning Transmission Electron Microscopy Ptychography... Pagination First page « First Previous page ‹‹ … Page 10 Current page 11 Page 12 … Next page ›› Last page Last » Key Links ORCID