Invention Reference Number
The Quantum-Optical Atomic Force Microscope (HOMAFM) is a revolutionary tool that combines quantum optical techniques with traditional atomic force microscopy (AFM). It delivers exceptional precision and sensitivity for nanoscale imaging and measurement, surpassing the limitations of conventional AFM. The HOMAFM is versatile, enabling non-destructive analysis across various environmental conditions, making it ideal for industries like biotechnology, materials science, and semiconductor manufacturing.
Description
The HOMAFM integrates a quantum optical interferometer with the force-sensing cantilever of an AFM. It utilizes the Hong-Ou-Mandel (HOM) effect, a quantum phenomenon, to enhance sensitivity and resolution. Similar to how a vinyl record player needle reads surface details, the HOMAFM's probe detects nanoscale features, even those invisible to optical microscopes. This innovation improves image quality and precision by leveraging quantum effects to reduce noise and achieve higher measurement sensitivity.
Benefits
- Enhanced sensitivity and resolution: Leverages quantum effects to detect finer details than conventional AFMs.
- Versatility: Operates in various environments, including ambient, vacuum, and cryogenic conditions.
- Non-destructive analysis: Suitable for delicate materials and structures.
- Multiple modalities: Supports various AFM methods, including imaging, force spectroscopy, and electrical conductivity measurement.
- Improved data quality: Reduces noise and improves signal clarity, resulting in more accurate nanoscale imaging.
Applications and Industries
- Biotechnology: Research and development of nanomaterials and biomolecular structures.
- Semiconductor manufacturing: Precision analysis of nanoscale components.
- Materials science: Characterization of advanced materials for innovation.
- Renewable energy: Development of efficient energy storage and conversion materials.
Contact
To learn more about this technology, email partnerships@ornl.gov or call 865-574-1051
