G-Mode SPM

General mode (G-Mode) atomic force microscopy is based on information-theory analysis of the direct data stream coming from the microscope photodetector. It allows for full exploration of complex tip-sample interaction reconstruction into mapping of multidimensional material properties.

Specifications:

• Frequency bandwidth: Hz-MHz
• LabVIEW software controls the gathering and saving of full photodiode data stream at 4MS/s.
• Compatible with all AFM platforms.

Applications:

Increasing the temporal resolution of electrical AFM modes such as Kelvin Probe force microscopy down to the µs time scale (has been applied to solar materials and polymers)

Allowing AI/ML analysis technique to work on big data type microscopy datasets in all spatio-temporal dimensions overcoming classical lock-in and phase locked loop processing.

References:

L. Collins et al. Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform (2017)

A. Belianinov et al. Complete information acquisition in dynamic force microscopy (2015)

L. Collins et al. Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space (2016).