The Nion UltraSTEM 100 provides atomic resolution imaging and spectroscopy with single atom sensitivity at middle and low voltage.
Specifications
- Cold field emission gun
- 3rd generation C3/C5 aberration corrector
- 60-100kV operation
- <1Å spatial resolution at 100 kV
- <1.1Å spatial resolution at 60 kV
- >0.5nA of current with atom-sized probe
- <350meV energy resolution at 100 kV
- Gatan Enfina EELS
- Ultra-stable sample stage
- Up to 5 samples can be loaded/exchanged with no vacuum degradation
- Flexible electron optics (diffraction and CTEM modes)
Atomically localized plasmon enhancement in monolayer graphene due to substitutional Si and N atoms