December 7, 2016 – A new microscopy technique developed at Oak Ridge National Laboratory enables rapid measurement of the dynamic state of materials used in memory storage and allows “imaging” of this phenomenon with unprecedented resolution (approximately 10 nanometers). The technique, detailed in Nature Communications, acquires the complete information from the microscope sensor that facilitates the extraction of material properties thousands of times faster than the current state of the art. The increased measurement and imaging speed provides a new window for understanding complex and dynamic material properties. Scientists are using this technique to study materials that are promising candidates for the next generation of electronic computing and storage devices.
