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Applications of Doppler-Free Saturation Spectroscopy for Edge Physics Studies...

by Elijah H Martin, Abdullah Zafar, John B Caughman, Ralph C Isler, Gary L Bell
Publication Type
Conference Paper
Journal Name
Review of Scientific Instruments
Publication Date
Page Number
11E402
Volume
87
Issue
11
Conference Name
High Temperature Plasma Diagnostics
Conference Location
Madison, Wisconsin, United States of America
Conference Date
-

Doppler-free saturation spectroscopy provides a very powerful method to obtained detailed information about the electronic structure of the atom through measurement of the spectral line profile. This is achieved through a significant decrease in the Doppler broadening and essentially an elimination of the instrument broadening inherent to passive spectroscopic techniques. In this paper we will present the technique and associated physics of Doppler-free saturation spectroscopy in addition to how one selects the appropriate transition. Simulations of Hδ spectra will be presented to illustrate the increased sensitivity to both electric field and electron density measurements.