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NIST/IEEE Virtual Manufacturing and Automation Competition: From Earliest Beginnings to Future Direction...

by Stephen Balakirsky, Rajmohan Madhavan, Chris Scrapper
Publication Type
Conference Paper
Book Title
Proceedings of the 2008 Performance Metrics for Intelligent Systems (PerMIS) Workshop
Publication Date
Publisher Location
Gaithersburg & New York, Maryland, United States of America
Conference Name
Performance Metrics for Intelligent Systems (PerMIS) Workshop
Conference Location
Gaithersburg, Maryland, United States of America
Conference Date
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