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In situ wavelength calibration of the edge CXS spectrometers on JET...

by Ephrem G Delabie, Theodore M Biewer, N. Hawkes, M. G. O'mullane
Publication Type
Conference Paper
Journal Name
Review of Scientific Instruments
Publication Date
Page Number
525
Volume
87
Issue
11
Conference Name
High temperature plasma diagnostics conference
Conference Location
Madison, Wisconsin, United States of America
Conference Date
-
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