Gene E Ice Contact icege@ornl.gov | 865.574.4065 Publications Short Focal Length Kirkpatrick-Baez Mirrors for a Hard X-Ray Nanoprobe... October, 2005 X-ray Microbeam Measurements of Subgrain Stress Distributions in Polycrystalline Materials... June, 2005 Nondestructive Three-Dimensional Characterization of Grain Boundaries by X-Ray Crystal Microscopy... June, 2005 Polychromatic X-Ray Microdiffraction Studies of Mesoscale Structure and Dynamics... March, 2005 Characterization of Stress Relaxation, Dislocations and Crystallographic Tilt Via X-ray Microdiffraction in GaN (0001) Layers... March, 2005 Pagination First page « First Previous page ‹‹ … Page 20 Current page 21 Page 22 Next page ›› Last page Last » View All
X-ray Microbeam Measurements of Subgrain Stress Distributions in Polycrystalline Materials... June, 2005
Nondestructive Three-Dimensional Characterization of Grain Boundaries by X-Ray Crystal Microscopy... June, 2005
Characterization of Stress Relaxation, Dislocations and Crystallographic Tilt Via X-ray Microdiffraction in GaN (0001) Layers... March, 2005