Ondrej E Dyck Electron Microscopist Contact dyckoe@ornl.gov | 336.262.7228 All Publications The importance of temporal and spatial incoherence in quantitative interpretation of 4D-STEM... Electron‐Beam‐Related Studies of Halide Perovskites: Challenges and Opportunities... Imaging Conductivity in a Single Atomic Layer... Super-Graphene: The Role of Temperature on Radiation Resistance... Reconstruction of the interatomic forces from dynamic scanning transmission electron microscopy data... Reconstruction of effective potential from statistical analysis of dynamic trajectories... Electron-beam introduction of heteroatomic Pt–Si structures in graphene... Variable voltage electron microscopy: Toward atom-by-atom fabrication in 2D materials... Direct matter disassembly via electron beam control: electron-beam-mediated catalytic etching of graphene by nanoparticles... Materials and Devices with Probes and Beams: Down to the Atomic Level and Back Up... Atomic Mechanisms for the Si Atom Dynamics in Graphene: Chemical Transformations at the Edge and in the Bulk... Pulsed Laser-Assisted Helium Ion Nanomachining of Monolayer Graphene—Direct-Write Kirigami Patterns... Building and exploring libraries of atomic defects in graphene: Scanning transmission electron and scanning tunneling microsc... A Versatile Common Platform for Quantum Transport Measurements in Fluidic, Cryogenic, and In Situ Electron Microscopy Environ... Structure retrieval from four-dimensional scanning transmission electron microscopy: Statistical analysis of potential pitfalls in high-dimensional data Toward Electrochemical Studies on the Nanometer and Atomic Scales: Progress, Challenges, and Opportunities... Atom-by-atom fabrication with electron beams Deep learning analysis of defect and phase evolution during electron beam-induced transformations in WS2... Manifold Learning of Four-dimensional Scanning Transmission Electron Microscopy Compressed Sensing of Scanning Transmission Electron Microscopy (stem) With Nonrectangular Scans Graphene milling dynamics during helium ion beam irradiation... Two-level structural sparsity regularization for identifying lattices and defects in noisy images... Multi-purposed Ar Gas Cluster Ion Beam Processing for Graphene Engineering Placing single atoms in graphene with a scanning transmission electron microscope Mitigating e-beam-induced hydrocarbon deposition on graphene for atomic-scale scanning transmission electron microscopy stu... Pagination First page « First Previous page ‹‹ Page 1 Current page 2 Page 3 Next page ›› Last page Last » Key Links Curriculum Vitae Google Scholar ORCID LinkedIn GitHub YouTube channel for video abstracts and conference presentations Organizations User Facilities Center for Nanophase Materials Sciences Nanomaterials Characterization Section Scanning Transmission Electron Microscopy Group