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ZEISS Head of Additive Manufacturing Technology Claus Hermannstaedter, left, and ORNL Interim Associate Laboratory Director for Energy Science and Technology Rick Raines sign a licensing agreement that allows ORNL’s machine-learning algorithm, Simurgh, to be used for rapid evaluations of 3D-printed components with industrial X-ray computed tomography, or CT. Using machine learning in CT scanning is expected to reduce the time and cost of inspections of 3D-printed parts by more than ten times.

A licensing agreement between the Department of Energy’s Oak Ridge National Laboratory and research partner ZEISS will enable industrial X-ray computed tomography, or CT, to perform rapid evaluations of 3D-printed components using ORNL’s machine

early prototype of the optical array developed by Oak Ridge National Laboratory.

IDEMIA Identity & Security USA has licensed an advanced optical array developed at Oak Ridge National Laboratory. The portable technology can be used to help identify individuals in challenging outdoor conditions.