Polyphase wireless power transfer system achieves 270-kilowatt charge, s...
Eva Zarkadoula, an R&D staff member at ORNL's Center for Nanophase Materials Sciences, has been named guest editor in a special issue on "Interface Engineering and Property Functionalization" for JOM.
ORNL’s electromagnetic isotope separator, or EMIS, made history in 2018 when it produced 500 milligrams of the rare isotope ruthenium-96, unavailable anywhere else in the world.
Anne Campbell, an R&D associate at ORNL, has been selected for an Emerging Professional award from ASTM International. ASTM, formerly the American Society for Testing and Materials, is an international standards organization that develops and publishes voluntary consensus technical standards for a wide range of materials, products, systems and services.
Computing pioneer Jack Dongarra has been elected to the National Academy of Sciences in recognition of his distinguished and continuing achievements in original research.
A method using augmented reality to create accurate visual representations of ionizing radiation, developed at ORNL, has been licensed by Teletrix, a firm that creates advanced simulation tools to train the nation’s radiation control workforce.
Valentino “Tino” Cooper, a scientist at ORNL, has been appointed to DOE’s Basic Energy Sciences Advisory Committee for a three-year term. Cooper’s research elucidates the fundamental understanding of advanced materials for next-generation energy and information technologies.
SAE International has awarded ORNL Buildings and Transportation Science Division Director Robert Wagner with the SAE Medal of Honor for his dedication and support of the organization’s mission of advancing mobility solutions.
Andrew Lupini, a scientist and inventor at ORNL, has been elected Fellow of the Microscopy Society of America.
Marm Dixit, a Weinberg Distinguished Staff Fellow at ORNL has received the 2023 Rosalind Franklin Young Investigator Award.
Researchers at ORNL have developed a machine-learning inspired software package that provides end-to-end image analysis of electron and scanning probe microscopy images.