ORNL scientists develop a sample holder that tumbles powdered photochemical materials within a neutron beamline — exposing more of the material to light for increased photo-activation and better photochemistry data capture.
ORNL researchers used electron-beam additive manufacturing to 3D-print the first complex, defect-free tungsten parts with complex geometries.
An advance in a topological insulator material — whose interior behaves like an electrical insulator but whose surface behaves like a conductor — could revolutionize the fields of next-generation electronics and quantum computing, according to scientists at ORNL.
A study led by Oak Ridge National Laboratory researchers identifies a new potential application in quantum computing that could be part of the next computational revolution.
Warming a crystal of the mineral fresnoite, ORNL scientists discovered that excitations called phasons carried heat three times farther and faster than phonons, the excitations that usually carry heat through a material.
A study by Oak Ridge National Laboratory researchers has demonstrated how satellites could enable more efficient, secure quantum networks.
Oak Ridge National Laboratory researchers serendipitously discovered when they automated the beam of an electron microscope to precisely drill holes in the atomically thin lattice of graphene, the drilled holes closed up.
A multi-lab research team led by ORNL's Paul Kent is developing a computer application called QMCPACK to enable precise and reliable predictions of the fundamental properties of materials critical in energy research.
Researchers at Oak Ridge National Laboratory have empirically quantified the shifts in routine daytime activities, such as getting a morning coffee or takeaway dinner, following safer at home orders during the early days of the COVID-19 pandemic.
An Oak Ridge National Laboratory team developed a novel technique using sensors to monitor seismic and acoustic activity and machine learning to differentiate operational activities at facilities from “noise” in the recorded data.