Updated software improves slicing for large-format 3D printing
A licensing agreement between the Department of Energy’s Oak Ridge National Laboratory and research partner ZEISS will enable industrial X-ray computed tomography, or CT, to perform rapid evaluations of 3D-printed components using ORNL’s machine
Scientist-inventors from ORNL will present seven new technologies during the Technology Innovation Showcase on Friday, July 14, from 8 a.m.–4 p.m. at the Joint Institute for Computational Sciences on ORNL’s campus.
An advance in a topological insulator material — whose interior behaves like an electrical insulator but whose surface behaves like a conductor — could revolutionize the fields of next-generation electronics and quantum computing, according to scientists at ORNL.
For more than 100 years, Magotteaux has provided grinding materials and castings for the mining, cement and aggregates industries. The company, based in Belgium, began its international expansion in 1968. Its second international plant has been a critical part of the Pulaski, Tennessee, economy since 1972.
Having passed the midpoint of his career, physicist Mali Balasubramanian was part of a tight-knit team at a premier research facility for X-ray spectroscopy. But then another position opened, at ORNL— one that would take him in a new direction.
An innovative and sustainable chemistry developed at ORNL for capturing carbon dioxide has been licensed to Holocene, a Knoxville-based startup focused on designing and building plants that remove carbon dioxide
ORNL’s Debangshu Mukherjee has been named an npj Computational Materials “Reviewer of the Year.”
Inspired by one of the mysteries of human perception, an ORNL researcher invented a new way to hide sensitive electric grid information from cyberattack: within a constantly changing color palette.
Marm Dixit, a Weinberg Distinguished Staff Fellow at ORNL has received the 2023 Rosalind Franklin Young Investigator Award.
Researchers at ORNL have developed a machine-learning inspired software package that provides end-to-end image analysis of electron and scanning probe microscopy images.