Scientific Achievement
Center of Mass (CoM) scanning transmission electron microscopy (STEM) allows simultaneous and robust atomic-scale imaging of light and heavy elements, which is not possible by conventional high angle annular dark field (HAADF)-STEM.
Significance and Impact
CoM-STEM can provide a better understanding of the full atomic-scale structure of battery materials through direct imaging and analysis, as demonstrated for LiCoO2.
Research Details
- Images showing both light and heavy elements were generated using the CoM of diffraction patterns acquired via a 2D array of probe positions across the sample.
- This technique was used to directly image Li, O, and Co columns in the battery electrode material, LiCoO2.
- Multislice electron scattering calculations were used to explore effects of experimental variables/conditions and sensitivity limits.
M.J. Zachman, Z. Yang, Y. Du, and M. Chi, ACS Nano, 16 1358-1367 (2022). DOI: 10.1021/acsnano.1c09374