Gene E Ice Contact icege@ornl.gov | 865.574.4065 All Publications X-ray MicroBeam Characterization of the Near Surface Nanostructure Layer in Ti after Friction Stir Processing... Polychromatic X-ray Micro- and Nano-Beam Science and Instrumentation... VESPERS: A Beamline for Combined XRF and XRD Measurements... Characterization of Growth Defects in Thin GaN Layers with X-ray Microbeam... Spatially Resolved Characterization of Plastic Deformation Induced by Focused-Ion Beam Processing in Structured InGaN/GaN Lay... Multiple Differential Aperture Microscopy... Diffuse X-ray Scattering Measurements of Point Defects and Clusters in Iron... Reflective Optics for Microdiffraction... White Beam Microdiffraction and Dislocations Gradients (Chapter 79)... Experimental Characterization of The Mesoscale Dislocation Density Tensor ... X-ray study of Pd<sub>40</sub>Cu<sub>30</sub>Ni<sub>10</sub>P<sub>20</sub> bulk metallic glass brazing filler for Ti-6Al-7Nb ... Relationship between pair and higher order correlations in solid solutions and other Ising systems... High-performance Kirkpatrick-Baez Supermirrors for Neutron Milli- and Micro-beams... Spatially resolved distribution of dislocations and crystallographic tilts in GaN layers grown on Si(111) substrates by maskl... Thermal and Electromigration-Induced Strains in Polycrystalline Films and Conductor Lines: X-Ray Microbeam Measurements and A... Characterization of Three-Dimensional Crystallographic Distributions Using Polychromatic X-ray Microdiffractions... Dislocations Arrangements in Shock-Recovered Al Single Crystals from White Beam Diffraction... Mesoscale Plastic Deformation in the Shock Recovered Metals from White Beam Diffraction... Polychromatic Microbeam Diffraction Characterization of Individual ZnO Nanostructures... Mapping Misorientation and Crystallographic Tilt in GaN Layers Via Polychromatic Microdiffraction... Spatially Resolved MicroDiffraction Analysis of the Plastic Deformation in the Shock Recovered Al Single Crystal... Spatially Resolved Characterization of Microstructure, Defects and Tilts in GaN Layers Grown on Si(111) Substrates by Maskles... Residual Stresses, Thermomechanical Behavior and Interfaces in the Weld Joint of Ni-based Superalloys... Characterization of Crystallographic Properties and Defects VIA X-ray Microdiffraction in GaN (0001) Layers... In-situ observations of oxidation and phase stability in cast nickel-based intermetallic alloys... Pagination First page « First Previous page ‹‹ … Page 3 Current page 4 Page 5 Next page ›› Last page Last »