Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection... Conference Paper August, 2023
AI-enabled Automation of Atomic Manipulation and Characterization in the STEM Conference Paper August, 2023
Discovering the Electron Beam Induced Transition Rates for Silicon Dopants in Graphene with Deep Neural Networks in the STEM Conference Paper August, 2023
Artificial neural network potentials for mechanics and fracture dynamics of two-dimensional crystals **... Journal July, 2023
Cyber Framework for Steering and Measurements Collection Over Instrument-Computing Ecosystems Conference Paper June, 2023
Disentangling Electronic Transport and Hysteresis at Individual Grain Boundaries in Hybrid Perovskites via Automated Scanning Probe Microscopy Journal May, 2023