Stephen Jesse Section Head of Nanomaterials Characterization at the CNMS Contact sjesse@ornl.gov | 865.384.8002 All Publications Multidimensional Dynamic Piezoresponse Measurements: Unraveling Local Relaxation Behavior in Relaxor-Ferroelectrics via Big D... Bias assisted scanning probe microscopy direct write lithography enables local oxygen enrichment of lanthanum cuprates thin f... Identification of phases, symmetries and defects through local crystallography... Differentiating Ferroelectric and Nonferroelectric Electromechanical Effects with Scanning Probe Microscopy... Mesoscopic Harmonic Mapping of Electromechanical Response in a Relaxor Ferroelectric... A-site stoichiometry and piezoelectric response in thin film PbZr1−xTixO3... Big Data and Deep data in scanning and electron microscopies: functionality from multidimensional data sets... Co-registered Topographical, Band Excitation Nanomechanical and Mass Spectral Imaging using a Combined Atomic Force Microscop... Domain Pinning Near a Single Grain Boundary in Tetragonal and Rhombohedral Lead Zirconate Titanate Films... Complete information acquisition in scanning probe microscopy ... Domain Wall Motion Across Various Grain Boundaries in Ferroelectric Thin Films... Defective interfaces in Yttrium-doped Barium Zirconate films and consequences on proton conduction... Band Excitation Kelvin probe force microscopy utilizing photothermal excitation... Big Data in Reciprocal Space: Sliding Fast Fourier Transforms for Determining Periodicity... Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films ... Atomic-Level Sculpting of Crystalline Oxides: Toward Bulk Nanofabrication with Single Atomic Plane Precision Complete information acquisition in dynamic force microscopy Carrier Density Modulation in Ge Heterostructure by Ferroelectric Switching... Kelvin Probe Force Microscopy in liquid using Electrochemical Force Microscopy... Identification of phases, symmetries and defects through local crystallography Probing Local Bias-Induced Transitions Using Photothermal Excitation Contact Resonance Atomic Force Microscopy and Voltage Sp... Multivariate mapping analysis of electronic structure on atomic level... Research Update: Spatially resolved mapping of electronic structure on atomic level by multivariate statistical analysis... Effect of Doping on Surface Reactivity and Conduction Mechanism in Sm-doped CeO2 Thin Films... Controlled mechanical modification of manganite surface with nanoscale resolution... Pagination First page « First Previous page ‹‹ … Page 7 Current page 8 Page 9 … Next page ›› Last page Last » Key Links Curriculum Vitae Google Scholar ORCID Organizations Physical Sciences Directorate User Facilities Center for Nanophase Materials Sciences Nanomaterials Characterization Section